Advantest Corporation, a semiconductor test equipment provider, and Synopsys, a leading provider of EDA software and solutions to the semiconductor industry, have integrated Advantest’s ACS Nexus solution with Synopsys’ SiliconDash for real-time data analytics.
Nexus allows access to aggregated data streams of multiple testing cells through a central, standardized software interface that is available on-premises. Advanced equipment platforms support ACS Nexus’ tight integration, which delivers superior real-time analytics performance. It is crucial that the semiconductor industry achieve stable yield maximums while achieving the highest quality possible.
Michael Chang, vice president, of ACS, with Advantest, said, “Enabling this capability today for our ecosystem customers and partners unlocks the industry’s creative capacity to develop the most powerful and advanced solutions for the future of semiconductor test.”
Amit Sanghani, Synopsys’ senior vice president, test, stated, “Collaborating with Advantest to enable the real-time-enabled version of SiliconDash leverages our companies’ key strengths. Combining ACS Nexus with SiliconDash will allow our joint customers to realize their full potential.”
In order to facilitate these approaches, as part of its Grand Design Strategy, Advantest has defined its vision for an open solution ecosystem where its teams, its customers, and third-party partners can collaborate on advanced machine learning and data analytics solutions.
Through a single centralized interface, customers and partners can now gather test data securely, reliably, and standardized, with fine-grained permission control by data owners. As a result of extending the existing data logging capabilities via this software-defined interface, both customers and data analytics providers will be able to further advance their analytical capabilities, quickly achieving the desired quality and yield with the greatest efficiency.
As a result, test floor operators will have substantially less burden to provide IT infrastructure for managing test data, thus improving the security and reliability of test floor operations, and ultimately improving overall equipment efficiency (OEE).
